2. Dependency of the Tunneling Decay Coefficient in Molecular Tunneling Junctions on the Topography of the Bottom Electrodes<br>Yuan, L.; Jiang, L.; Zhang, B.; Nijhuis, C. A. , Angew. Chem. Int. Ed. 2014, 53, 3377-3381.-Department of Chemistry, Tsinghua University

2. Dependency of the Tunneling Decay Coefficient in Molecular Tunneling Junctions on the Topography of the Bottom Electrodes Yuan, L.; Jiang, L.; Zhang, B.; Nijhuis, C. A. , Angew. Chem. Int. Ed. 2014, 53, 3377-3381.
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Yuan, L.; Jiang, L.; Zhang, B.; Nijhuis, C. A. , Angew. Chem. Int. Ed. 2014, 53, 3377-3381.
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